Checking date: 19/05/2022


Course: 2022/2023

Advanced sensors and measurements techniques
(18327)
Study: Bachelor in Engineering Physics (363)


Coordinating teacher: ACEDO GALLARDO, PABLO

Department assigned to the subject: Electronic Technology Department

Type: Compulsory
ECTS Credits: 3.0 ECTS

Course:
Semester:




Requirements (Subjects that are assumed to be known)
Electromagnetism and Optics Solid State Fundamentals for Engineering Electronic Engineering Fundamentals Statistical Physics Instrumentation and Measurements Photonics
Objectives
To know the fundamentals behind MEMS and MOEMS based sensors, as well as the latest developments in new materials and manufacturing processes for sensors, and their field of application. To know the fundamentals of microfluidic systems and their use in instrumentation and measurement systems in biomedical and biological environments. To know various instruments and experimental techniques of general use in research and development of devices and instruments of high added value: microscopy and spectroscopy among others.
Skills and learning outcomes
Description of contents: programme
1.- MEMS. Microelectromechanical Systems Introduction. Scaling laws. Microsystems design fundamentals. Examples. MEMS Sensors examples and applications 2.- Optical MEMS (MOEMS). Introduction and classification. Micromirror-based devices and scanning applications MOEMS for signal processing and communications 3.-Microfabrication processes and techniques for MEMS and other sensors. Bulk micromaching Surface micromachining Additive manufacturing of microstructures. 4.-New materials and components for sensors. Organic electronics and photonics. Flexible electronics Surface functionalization and biosensors. 5.-Microfluidic Sensors. Revision: microfluidics fundamentals and components Microfluidic Sensors examples Lab-on-a-chip and organ-on-a-chip 6.-Advanced instrumentation and experimental techniques Optical microscopy, fluorescence microscopy and confocal microscopy. Spectroscopy
Learning activities and methodology
AF1. THEORETICAL-PRACTICAL CLASSES. AF3. STUDENT INDIVIDUAL WORK OR GROUP WORK. AF8. WORKSHOPS AND LABORATORY SESSIONS. AF9. FINAL EXAM. MD1. THEORY CLASS. MD2. PRACTICAL CLASS.
Assessment System
  • % end-of-term-examination 50
  • % of continuous assessment (assigments, laboratory, practicals...) 50
Calendar of Continuous assessment
Basic Bibliography
  • Liu C. . Foundations of MEMS. Second Edition. Prentice Hall . 2012
Additional Bibliography
  • Kaajakari V. . Practical MEMS. Small Gear Publising . 2009
  • Tkachenko N.V. . Optical Spectroscopy. Methods and Instrumentations. Elsevier. 2006

The course syllabus may change due academic events or other reasons.